Fault models and test methods for subthreshold SRAMs

@article{Lin2010FaultMA,
  title={Fault models and test methods for subthreshold SRAMs},
  author={Chen-Wei Lin and Hung-Hsin Chen and Hao-Yu Yang and Mango Chia-Tso Chao and Rei-Fu Huang},
  journal={2010 IEEE International Test Conference},
  year={2010},
  pages={1-10}
}
Due to the increasing demand of an extra-low-power system, a great amount of research effort has been spent in the past to develop an effective and economic subthreshold-SRAM design. However, the test methods regarding those newly developed subthreshold-SRAM designs have not yet been fully discussed. In this paper, we first categorize the subthreshold-SRAM designs into three types, study the faulty behavior of different open defects for each type of designs, and then identify the faults which… CONTINUE READING

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