Fault and Reliability Analysis of Carbon Nano Tube Fet Sram in the Presence of Single Event Upset

Carbon nano tube devices are considered as a better replacement for CMOS technology nowadays due to it s decreased sizing and increased performance. Resisti v open and bridging faults play vital role in the dynamic fault analysis. These faults are important since th e number of interconnects have increased. In this s udy we discuss the effect of open and… CONTINUE READING