Fault Detection Probability Evaluation Approach in Combinational Circuits Using Test Set Generation Method

@inproceedings{Arya2018FaultDP,
  title={Fault Detection Probability Evaluation Approach in Combinational Circuits Using Test Set Generation Method},
  author={Namita Arya and Amit Prakash Singh},
  year={2018}
}
This paper introduces an approach that chooses the fault detection by calculating probabilities using probability mass function (pmf) and cumulative distribution function (CDF). This work used a method for multiple stuck-at faults by producing a new test pattern in combinational circuits. We assumed that existence of all multiple faults is only because of one single component that is faulty. A complete test set can be created by all possible single stuck-at faults in a combinational circuit… 
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