Fault Clustering in deep-submicron CMOS Processes

@article{Schat2008FaultCI,
  title={Fault Clustering in deep-submicron CMOS Processes},
  author={Jan Schat},
  journal={2008 Design, Automation and Test in Europe},
  year={2008},
  pages={511-514}
}
The fraction of ICs that pass all production tests but fail in the application is called the defect level. Defect levels depend on the average number of defects per IC, and also on the clustering of these defects. High clustering leads to a higher yield and a lower defect level. This paper compiles the coefficients for defect clustering using research… CONTINUE READING