Fast imaging of partially conductive linear cracks using impedance data

@article{Bryan2006FastIO,
  title={Fast imaging of partially conductive linear cracks using impedance data},
  author={Kurt Bryan and Janine Haugh and David McCune},
  journal={Inverse Problems},
  year={2006},
  volume={22},
  pages={1337-1358}
}
We develop two closely-related fast and simple numerical algorithms to address the inverse problem of identifying a collection of disjoint linear cracks in a two-dimensional homogeneous electrical conductor from exterior boundary voltage/current measurements. We allow the possibility that the cracks are partially conductive. Our approach also allows us to determine the actual number of cracks present, as well as make use of one or multiple input fluxes. We illustrate our algorithms with a… 
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