Fast and Robust Method for Measuring Semiconductor Optical Amplifier Gain

Abstract

In this paper, we present a new, robust multipoint fitting method for gain measurement with a metric for quality estimation of the procedure. The method is able to identify the deleterious effect of imperfections within the test structures, is tolerant to optical coupling errors and is well suited to high throughput, generic, automated testing of… (More)

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Cite this paper

@article{Pustakhod2018FastAR, title={Fast and Robust Method for Measuring Semiconductor Optical Amplifier Gain}, author={Dzmitry Pustakhod and Kevin A. Williams and Xaveer J. M. Leijtens}, journal={IEEE Journal of Selected Topics in Quantum Electronics}, year={2018}, volume={24}, pages={1-9} }