Fast TDDB for early reliability monitoring


This work presents a new experimental setup to perform highly accelerated Time Dependent Dielectric Breakdown (TDDB) in constant voltage stress (CVS) mode with capability of collecting failure distributions in sub millisecond regime. The new apparatus is capable of collecting failure times down to tens of microseconds and we demonstrate that power law… (More)


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@article{Larow2016FastTF, title={Fast TDDB for early reliability monitoring}, author={Catherine Larow and Y. Liu and Zakariae Chbili and Abdullah Gondal}, journal={2016 IEEE International Integrated Reliability Workshop (IIRW)}, year={2016}, pages={53-56} }