## Iterative OPDD based signal probability calculation

- Avijit Dutta, Nur A. Touba
- 24th IEEE VLSI Test Symposium
- 2006

Data correlation is a well-known problem that causes difficulty in VLSI testing. Based on a correlation metric, an efficient heuristic to select BIST registers has been proposed in the previous work. However, the computation of data correlation itself was a computational intensive process and became a bottleneck in the previous work. This paper presents an… (More)