Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors

  title={Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors},
  author={Michael S. Hsiao and Elizabeth M. Rudnick and Janak H. Patel},
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a small set of states, and some states are frequently re-visited throughout the application of a test set. Subsequences that start and end on the same states may be removed if necessary and su cient conditions are met for them. The techniques require only two fault simulation passes and are applied to test sequences… CONTINUE READING


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