Fast, versatile, and non-destructive biscuit inspection system using spectral imaging

Abstract

A fast, versatile, and non-destructive method for assessing biscuit quality is presented. The method integrates color (or browning) measurement, moisture assessment, compositional and dimensional measurements on a spectral imaging platform using the silicon range 400–1000 nm. 
DOI: 10.23919/MVA.2017.7986910

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