Fast, Non-Monte-Carlo Estimation of Transient Performance Variation Due to Device Mismatch

@article{Kim1996FastNE,
  title={Fast, Non-Monte-Carlo Estimation of Transient Performance Variation Due to Device Mismatch},
  author={Jaeha Kim and Kevin D. Jones and Mark Horowitz},
  journal={IEEE Transactions on Circuits and Systems I: Regular Papers},
  year={1996},
  volume={57},
  pages={1746-1755}
}
This paper describes a noise-based method of estimating the effects of device random mismatch on circuit's transient response, such as delay and frequency. The proposed method models DC mismatch as equivalent AC pseudo-noise and exploits the fast periodic noise analysis (PNOISE) available in RF circuit simulators to compute the resulting variation in the circuit response. While the method relies on Gaussian mismatch distributions and linear perturbation model, it can model and analyze… CONTINUE READING
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