Failure diagnosis of structured VLSI

  title={Failure diagnosis of structured VLSI},
  author={J. A. Waicukauski and Eric Lindbloom},
  journal={IEEE Design & Test of Computers},
The authors describe a method for diagnosing the failures observed in testing VLSI designs that use the scan-path structure. Diagnosis consists of simulating selected faults after testing using a fault simulator that allows the application of several patterns in parallel. The method is also suitable for signature-based random-pattern testing. The authors discuss diagnostic fault simulation, fault-list generation, relating faults to defects, diagnostic strategy, and random-pattern failures, and… CONTINUE READING
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