Failure diagnosis of structured VLSI

@article{Waicukauski1989FailureDO,
  title={Failure diagnosis of structured VLSI},
  author={J. A. Waicukauski and Eric Lindbloom},
  journal={IEEE Design & Test of Computers},
  year={1989},
  volume={6},
  pages={49-60}
}
The authors describe a method for diagnosing the failures observed in testing VLSI designs that use the scan-path structure. Diagnosis consists of simulating selected faults after testing using a fault simulator that allows the application of several patterns in parallel. The method is also suitable for signature-based random-pattern testing. The authors discuss diagnostic fault simulation, fault-list generation, relating faults to defects, diagnostic strategy, and random-pattern failures, and… CONTINUE READING
Highly Cited
This paper has 168 citations. REVIEW CITATIONS

3 Figures & Tables

Topics

Statistics

01020'94'97'00'03'06'09'12'15'18
Citations per Year

169 Citations

Semantic Scholar estimates that this publication has 169 citations based on the available data.

See our FAQ for additional information.