Failure Mechanisms in Embedded Planar Capacitors during High Temperature Operating Life ( HTOL ) Testing

@inproceedings{Alam2011FailureMI,
  title={Failure Mechanisms in Embedded Planar Capacitors during High Temperature Operating Life ( HTOL ) Testing},
  author={Mohammed A. Alam and Michael H. Azarian and Michael Osterman and Michael G. Pecht},
  year={2011}
}
High temperature operating life (HTOL) testing was performed on embedded planar capacitors (with epoxyBaTiO3 composite dielectric) by subjecting these devices to highly accelerated temperature and voltage aging conditions. The objective of HTOL testing was to precipitate avalanche breakdown failures as a result of defects in the composite dielectric. These defects include porosity, voids, and agglomeration of BaTiO3 in the epoxy matrix and are introduced during the manufacturing process. Since… CONTINUE READING

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