Failing vector identification based on overlapping intervals of test vectors in a scan-BIST environment

@article{Liu2003FailingVI,
  title={Failing vector identification based on overlapping intervals of test vectors in a scan-BIST environment},
  author={Chunsheng Liu and Krishnendu Chakrabarty},
  journal={IEEE Trans. on CAD of Integrated Circuits and Systems},
  year={2003},
  volume={22},
  pages={593-604}
}
We present a new scan built-in self-test (BIST) approach for determining failing vectors for fault diagnosis. This approach is based on the application of overlapping intervals of test vectors to the circuit under test, and it is especially suitable for faults that are detected by a relatively small number of pseudorandom test patterns. Two multiple-input signature registers are used in an interleaved fashion to generate intermediate signatures, thereby obviating the need for multiple test… CONTINUE READING

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