Facilitated tip-positioning and applications of non-electrode tips in scanning electrochemical microscopy using a shear force based constant-distance mode.

@article{Hengstenberg2000FacilitatedTA,
  title={Facilitated tip-positioning and applications of non-electrode tips in scanning electrochemical microscopy using a shear force based constant-distance mode.},
  author={Andreas Hengstenberg and Christine Kranz and Wolfgang Schuhmann},
  journal={Chemistry},
  year={2000},
  volume={6 9},
  pages={1547-54}
}
In scanning electrochemical microscopy (SECM) a microelectrode is usually scanned over a sample without following topographic changes (constant-height mode). Therefore, deconvolution of effects from distance variations arising from non-flat sample surface and electrochemical surface properties is in general not possible. Using a shear force-based constant distance mode, information about the morphology of a sample and its localized electrochemical activity can be obtained simultaneously. The… CONTINUE READING

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