Facile sample preparation method allowing TEM characterization of the stacking structures and interlayer spaces of clay minerals

@inproceedings{Liu2019FacileSP,
  title={Facile sample preparation method allowing TEM characterization of the stacking structures and interlayer spaces of clay minerals},
  author={Dong Liu and Qian Ru Tian and Peng Yuan and Peixin Du and Junming Zhou and Yun Li and Hongling Bu and Jieyu Zhou},
  year={2019}
}
Abstract Transmission electron microscopy (TEM) is an essential and irreplaceable technique for studying the micromorphology and microstructure of clay minerals. However, observing layer stacking and detecting the interlayer spaces of clay minerals by TEM are still major challenges, due to the difficulty of finding suitable fields of view for clay planes along the [00l] direction. A simple and effective sample pretreatment method was proposed here for TEM characterization of clay mineral… CONTINUE READING