FITTest BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties

@article{Pecenka2006FITTestBA,
  title={FITTest BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties},
  author={Tomas Pecenka and Zdenek Kot{\'a}sek and Luk{\'a}s Sekanina},
  journal={2006 IEEE Design and Diagnostics of Electronic Circuits and systems},
  year={2006},
  pages={283-287}
}
In the paper, the FITTest_BENCH06 set of synthetic benchmark circuits is presented for the evaluation of diagnostic methods and tools. The structure of benchmark circuits together with their diagnostic properties is described. The set consists of 31 circuits at various levels of complexity (2000, 10000, 28000, 100000, 150000 and 300000 gates). Four circuits with different diagnostic properties are available for each level of circuit complexity (fault coverage is approx. 0%, 33%, 66% and 100… CONTINUE READING

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