FCDM measurements of small devices

  title={FCDM measurements of small devices},
  author={Martin Johnson and Ryan Ashton and Scott Ward},
  journal={2009 31st EOS/ESD Symposium},
Peak current measurements using high bandwidth oscilloscopes show that even small packages exhibit high amplitude FCDM currents. The effects of support templates and vacuum holes on the measured FCDM current waveform are discussed and analyzed, along with other challenges of FCDM stressing small footprint devices. 
4 Citations
6 References
Similar Papers


Publications referenced by this paper.
Showing 1-6 of 6 references

Field-Induced Charged-Device Model Test Method for Electrrostatic-Discharge- Withstand Thresholds of Microelectronic Components

  • JESD22-C101D
  • JEDEC, 2008.
  • 2008
1 Excerpt

Impact of the CDM tester ground plane capacitance on The DUT stress level

  • C. Goeau
  • EOS/ESD EOS-27,
  • 2005

Similar Papers

Loading similar papers…