F-scan: An approach to functional RTL scan for assignment decision diagrams

  title={F-scan: An approach to functional RTL scan for assignment decision diagrams},
  author={Marie Engelene J. Obien and Hideo Fujiwara},
  journal={2009 IEEE 8th International Conference on ASIC},
This paper presents a new methodology for functional Register Transfer Level (RTL) scan, in which existing functional elements and paths can be maximally utilized. The approach is called F-scan, which primarily aims to reduce the total area overhead due to augmentation for testing. Since the method allows for parallel scanning of test vectors, test application time is also made to be at the minimum. The case study shows the effectiveness of our approach compared to full scan design1. 

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