F-PLD data retention times and test methods

Abstract

Data retention times in Non-Volatile Memory (NVM) components are an issue that is pervasive throughout industry, but left unaddressed due to product life cycles, typically, being significantly under the retention time or as is often the case the data on the NVM component is simply refreshed when a problem arises. In this paper we outline the initial process… (More)

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Cite this paper

@article{Warren2015FPLDDR, title={F-PLD data retention times and test methods}, author={Gary Warren and Michael Demmick and Russell Warren}, journal={2015 Annual Reliability and Maintainability Symposium (RAMS)}, year={2015}, pages={1-6} }