• Corpus ID: 256358776

Extraordinary-log Universality of Critical Phenomena in Plane Defects

@inproceedings{Sun2023ExtraordinarylogUO,
  title={Extraordinary-log Universality of Critical Phenomena in Plane Defects},
  author={Yanan Sun and Minghui Hu and Jian-Ping Lv},
  year={2023}
}

• Yanan Sun, Minghui Hu, Jian-Ping Lv
• Published 27 January 2023
• Physics

There is growing evidence that extraordinary-log critical behavior emerges on the open surfaces of critical systems in a semi-infinite geometry. Here, using extensive Monte Carlo simulations, we observe extraordinary-log critical behavior on the plane defects of O(2) critical systems in an infinite geometry. In this extraordinary-log critical phase, the large-distance two-point correlation G obeys the logarithmic finite-size scaling G ∼ (ln L ) − ˆ q with the linear size L , having the critical exponent ˆ q = 0 . 29(2) . Meanwhile, the helicity modulus Υ follows the scaling form Υ ∼ α (ln L ) /L with the universal parameter α = 0 . 56(3) . The values of ˆ q and α do not fall into any known universality class of critical phenomena, yet they conform to the scaling relation of extraordinary-log universality. We also discuss the extension of current results to a quantum system that is experimentally accessible. These findings reshape our understanding of extraordinary-log critical phenomena.