Extraction of the Random Component of Time-Dependent Variability Using Matched Pairs

Abstract

Based on the so-called defect-centric statistics, we propose the average impact of a single charged trap on FET threshold voltage as a physically based measure of the random component of time-dependent variability. We show that it can be extracted using matched pairs, analogously to time-zero variability. To that end, the defect-centric statistics of… (More)

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Cite this paper

@article{Kaczer2015ExtractionOT, title={Extraction of the Random Component of Time-Dependent Variability Using Matched Pairs}, author={Ben Kaczer and Jacopo Franco and Philippe Roussel and Guido Groeseneken and Thomas Chiarella and Naoto Horiguchi and Tibor Grasser}, journal={IEEE Electron Device Letters}, year={2015}, volume={36}, pages={300-302} }