Extracting redundancy-aware top-k patterns

@inproceedings{Xin2006ExtractingRT,
  title={Extracting redundancy-aware top-k patterns},
  author={Dong Xin and Hong Cheng and Xifeng Yan and Jiawei Han},
  booktitle={KDD},
  year={2006}
}
Observed in many applications, there is a potential need of extracting a small set of frequent patterns having not only high significance but also low redundancy. The significance is usually defined by the context of applications. Previous studies have been concentrating on how to compute top-k significant patterns or how to remove redundancy among patterns separately. There is limited work on finding those top-k patterns which demonstrate high-significance and low-redundancy simultaneously.In… CONTINUE READING

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