Extending the capability of STM break junction for conductance measurement of atomic-size nanowires: an electrochemical strategy.

Abstract

The STM break junction (STM-BJ) and mechanically controllable break junction (MCBJ) are the two most widely applied techniques to fabricate atomic-size nanowires for conductance measurement. However, the drawbacks of the mechanical crashing between the two electrodes of the same material in these techniques hamper its capability of application in view of… (More)
DOI: 10.1021/ja8055276

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