Extending fault-based testing to microelectromechanical systems

@article{Mir1999ExtendingFT,
  title={Extending fault-based testing to microelectromechanical systems},
  author={Salvador Mir and Beno{\^i}t Charlot and Bernard Courtois},
  journal={European Test Workshop 1999 (Cat. No.PR00390)},
  year={1999},
  pages={64-68}
}
As stable fabrication processes for microelectromechanical systems (MEMS) emerge, research efforts shift towards the design of systems of increasing complexity. The ways in which testing is going to be performed for large volume complex devices embedding MEMS are not known. As in the microelectronics industry the development of cost-effective tests for larger systems may well require test stimuli targeting actual faults, developing fault lists and fault models for realistic manufacturing… CONTINUE READING
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