Exploring the Synergy of Emerging Workloads and Silicon Reliability Trends

@inproceedings{Kruijf2009ExploringTS,
  title={Exploring the Synergy of Emerging Workloads and Silicon Reliability Trends},
  author={Marc de Kruijf and Karthikeyan Sankaralingam},
  year={2009}
}
Technology constraints and application characteristics are radically changing as we scale to the end of silicon technology. Devices are becoming increasingly brittle, highly varying in their properties, and error-prone, leading to a fundamentally unpredictable hardware substrate. Applications are also changing, and emerging new classes of applications are increasingly relying on probabilistic methods. They have an inherent tolerance for uncertaintyand can tolerate hardware errors. This paper… CONTINUE READING

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