Exploring Data-Level Error Tolerance in High-Performance Solid-State Drives

@article{Xu2015ExploringDE,
  title={Exploring Data-Level Error Tolerance in High-Performance Solid-State Drives},
  author={Xin Xu and H. Howie Huang},
  journal={IEEE Transactions on Reliability},
  year={2015},
  volume={64},
  pages={15-30}
}
Flash storage systems have exhibited great benefits over magnetic hard drives such as low input-output (I-O) latency, and high throughput. However, NAND flash based Solid-State Drives (SSDs) are inherently prone to soft errors from various sources, e.g., wear-out, program and read disturbance, and hot-electron injections. To address this issue, flash devices employ different error-correction codes (ECC) to detect and correct soft errors. Using ECC induces non-trivial overhead costs in terms of… CONTINUE READING

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