Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores

  title={Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores},
  author={Davide Appello and Paolo Bernardi and Alessandra Fudoli and Maurizio Rebaudengo and Matteo Sonza Reorda and Vincenzo Tancorre and Massimo Violante},
This paper addresses the issue of testing and diagnosing a memory core embedded in a complex SOC. The proposed solution is based on a P1500-compliant wrapper that follows a programmable BIST approach and is able to support both testing and diagnosis. Experimental results are provided allowing to evaluate the benefits and limitations of the adopted solution and to compare it with previously proposed ones. The solution takes into account several constraints existing in an industrial environment… CONTINUE READING
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