Exploiting DRAM restore time variations in deep sub-micron scaling

  title={Exploiting DRAM restore time variations in deep sub-micron scaling},
  author={XianWei Zhang and Youtao Zhang and Bruce R. Childers and Jun Yang},
  journal={2015 Design, Automation & Test in Europe Conference & Exhibition (DATE)},
Recent studies reveal that one of the major challenges in scaling DRAM in deep sub-micron regime is its significant variations on cell restore time, which affects timing constraints such as write recovery time tWR. Adopting traditional approaches results in either low yield rate or large performance degradation. In this paper, we propose schemes to expose the variations to the architectural level. By constructing memory chunks with different accessing speeds and, in particular, exploiting the… CONTINUE READING
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