Experimental verification of high speed AFM through local raster scanning

@article{Huang2013ExperimentalVO,
  title={Experimental verification of high speed AFM through local raster scanning},
  author={Peng Huang and Sean B. Andersson},
  journal={2013 American Control Conference},
  year={2013},
  pages={6051-6056}
}
Local raster scanning is an algorithm for using the data acquired by an atomic force microscope in real time to steer the tip so that it stays on a sample of interest. The algorithm is suitable for all samples that are “string-like” in nature and has been shown through simulation and experiment to produce an order-of-magnitude improvement in imaging rate. This paper presents experiment results of applying the algorithm to gratings, demonstrating this improvement in speed. We compare the results… CONTINUE READING

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