Examination of fracture surfaces using focused ion beam milling

@article{Cairney2000ExaminationOF,
  title={Examination of fracture surfaces using focused ion beam milling},
  author={J. Cairney and P. Munroe and J. Schneibel},
  journal={Scripta Materialia},
  year={2000},
  volume={42},
  pages={473-478}
}
  • J. Cairney, P. Munroe, J. Schneibel
  • Published 2000
  • Materials Science
  • Scripta Materialia
  • Composite materials consisting of an iron aluminide matrix with composition approximately Fe-40at%Al, reinforced with a volume fraction of 40--70% ceramic particles (TiC, WC, TiB{sub 2} or ZrB{sub 2}), are currently being developed. Focused ion beam milling is a relatively new tool to materials science. It uses a high resolution (<5nm), energetic beam of gallium ions to selectively sputter regions of a material, whilst also functioning as a scanning ion microscope. The milling accuracy is of… CONTINUE READING
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