Examination of fracture surfaces using focused ion beam milling

@inproceedings{Cairney2000ExaminationOF,
  title={Examination of fracture surfaces using focused ion beam milling},
  author={Julie M. Cairney and Paul Munroe and Joachim H. Schneibel},
  year={2000}
}

• Julie M. Cairney, Paul Munroe, Joachim H. Schneibel
• Published 2000
• DOI:10.1016/s1359-6462(99)00374-7

Composite materials consisting of an iron aluminide matrix with composition approximately Fe-40at%Al, reinforced with a volume fraction of 40--70% ceramic particles (TiC, WC, TiB{sub 2} or ZrB{sub 2}), are currently being developed. Focused ion beam milling is a relatively new tool to materials science. It uses a high resolution (<5nm), energetic beam of gallium ions to selectively sputter regions of a material, whilst also functioning as a scanning ion microscope. The milling accuracy is of… CONTINUE READING

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