Examination of contact lens surfaces by Atomic Force Microscope (AFM).

@article{Bhatia1997ExaminationOC,
  title={Examination of contact lens surfaces by Atomic Force Microscope (AFM).},
  author={Subir Singh Bhatia and E. L. P. Stanley J. Goldberg and Jim Enns},
  journal={The CLAO journal : official publication of the Contact Lens Association of Ophthalmologists, Inc},
  year={1997},
  volume={23 4},
  pages={264-9}
}
PURPOSE We evaluated the use of Atomic Force Microscopy (AFM) in examining the surfaces of unused and worn hydrogel contact lenses under natural, fully hydrated conditions. METHODS Using the AFM contact mode, we examined hydrogel lenses (Acuvue, Surevue, NewVues, CSI Clarity, SeeQuence) that were hydrated. RESULTS Surface morphologies characteristics of each lens type and wear history were readily observed. The surfaces of worn lenses showed evidence of abrasion and altered morphology… CONTINUE READING

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