Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST

@inproceedings{Polian2003EvolutionaryOO,
  title={Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST},
  author={Ilia Polian and Bernd Becker and Sudhakar M. Reddy},
  booktitle={DATE},
  year={2003}
}
Recent work [1] showed that Markov sources lead to scan BIST designs of lower cost compared to earlier proposed methods in scan BIST. However the method presented in [1] utilizes tests generated using a deterministic test generator for target faults in synthesizing the Markov source to generate the tests. The requirement of a deterministic test generator may hinder the use of this procedure in industrial settings since the BIST tool must also include a deterministic ATPG tool that may add to… CONTINUE READING

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