Evaluation of two-dimensional displacement components of symmetrical deformation by phase-shifting electronic speckle pattern interferometry.

Abstract

A method for the isolation of two-dimensional (2D) displacement components by using one phase map obtained by phase-shifting electronic speckle pattern interferometry (ESPI) is presented. When the typical ESPI is used for displacement measurement, a mixed phase distribution of deformation is measured. If the deformation of the object is symmetrical, two… (More)

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