Evaluation of overshoot rate of lightning impulse withstand voltage test waveform based on new base curve fitting methods - study by assuming waveforms generated in an actual test circuit -

@article{Ueta2010EvaluationOO,
  title={Evaluation of overshoot rate of lightning impulse withstand voltage test waveform based on new base curve fitting methods - study by assuming waveforms generated in an actual test circuit -},
  author={Genyo Ueta and Toshihiro Tsuboi and Shigemitsu Okabe},
  journal={IEEE Transactions on Dielectrics and Electrical Insulation},
  year={2010},
  volume={17}
}
The authors have studied fitting methods to extract a more reasonable base curve from the lightning impulse voltage test waveforms. In this paper, by assuming a test circuit of actual large-sized UHV class equipment, simulated recorded waveforms were created, to which various fitting methods were applied in order to study their merits and demerits… CONTINUE READING