Evaluation of overshoot rate of lightning impulse withstand voltage test waveform based on new base curve fitting methods

@article{Ueta2010EvaluationOO,
  title={Evaluation of overshoot rate of lightning impulse withstand voltage test waveform based on new base curve fitting methods},
  author={Genyo Ueta and Toshihiro Tsuboi and Jun Takami and Shigemitsu Okabe and Hideo Hirose},
  journal={IEEE Transactions on Dielectrics and Electrical Insulation},
  year={2010},
  volume={17}
}
The k-factor, which evaluates an overshoot of the withstand voltage test waveform in a lightning impulse withstand voltage test, is about to be adopted in IEC 60060-1 that specifies high-voltage test techniques for electric power equipment. In its procedure, it is defined that the recorded waveforms are fitted with a double exponential function to derive a base curve. For some waveforms, however, an extracted base curve sometimes deviates upward from the central lines of the recorded waveforms… CONTINUE READING