Evaluation of microindentation properties of epitaxial 3C–SiC/Si thin films

@inproceedings{Geetha2016EvaluationOM,
  title={Evaluation of microindentation properties of epitaxial 3C–SiC/Si thin films},
  author={D. Geetha and P. Joice Sophia and Dakshnamoorthy Arivuoli},
  year={2016}
}
The microhardness characteristics of 3C–SiC/Si films grown by vapor phase epitaxy were investigated using Vickers and Knoop indenters. The observed hardness behavior at lower load range is being attributed to indentation size effect while the substrate hardness effect is found to be prominent at higher loads. The related mechanical properties such as fracture toughness, brittleness index, and yield stress were also evaluated. In order to study the nature and behavior of the surface topography… CONTINUE READING