Evaluation of conductive-to-resistive layers interaction in thick-film resistors

@article{Mleczko2008EvaluationOC,
  title={Evaluation of conductive-to-resistive layers interaction in thick-film resistors},
  author={K. Mleczko and Z. Zawislak and A. W. Stadler and Andrzej Kolek and Andrzej Dziedzic and J. Cichosz},
  journal={Microelectronics Reliability},
  year={2008},
  volume={48},
  pages={881-885}
}
Low-frequency noise spectroscopy is used to examine the interactions between resistive and conductive films that take place during thick-film resistor (TFR) fabrication. Two noise parameters are introduced to quantitatively describe the strength of these interactions. They refer to intensity and repeatability of the noise generated in the resistor interfaces. Extensive experimental studies performed on ruthenium dioxide and bismuth ruthenate TFRs terminated with gold, platinum–gold, palladium… CONTINUE READING

References

Publications referenced by this paper.
Showing 1-10 of 19 references

Noise and switching phenomena in thick-film resistors

  • A Kolek, AW Stadler, Z Zawiślak, K Mleczko, A. Dziedzic
  • J Phys D
  • 2008
2 Excerpts

Lowfrequency 1/f noise of RuO2-glass thick resistive film

  • A Kolek, AW Stadler, P Ptak, Z Zawiślak, K Mleczko, P Szałański
  • J Appl Phys 2007;102:103718
  • 2007
1 Excerpt

Noise characteristics of resistors buried in lowtemperature co-fired ceramics

  • A Kolek, P Ptak, A. Dziedzic
  • J Phys D
  • 2003
2 Excerpts

Investigation of possible correlation between current noise and long-term stability of thickfilm resistors

  • D Belavic, D Rocak, J Sikula, M Hrovat, B Koktavy, J. Pavelka
  • Proceedings of IMAPS-Europe,
  • 2000

Thick-film quality indicator based on noise index measurements

  • MM Jevtić, I Mrak, Z. Stanimirović
  • Microelectron J 1999;30:1255–9
  • 1999
1 Excerpt

Influence of the contacts and firing process on the properties of thick film resistors on alumina and dielectrics

  • M Jakubowska, K. Pitt
  • J Mater Sci: Mater Electron 1995;6:75–8
  • 1995
1 Excerpt

Noise as a diagnostic and prediction tool in reliability physics

  • MM Jevtić
  • Microelectron Reliab
  • 1995

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