Evaluation of C60 secondary ion mass spectrometry for the chemical analysis and imaging of fingerprints.

  title={Evaluation of C60 secondary ion mass spectrometry for the chemical analysis and imaging of fingerprints.},
  author={Edward Sisco and Leonard T Demoranville and Greg Gillen},
  journal={Forensic science international},
  volume={231 1-3},
The feasibility of using C60(+) cluster primary ion bombardment secondary ion mass spectrometry (C60(+) SIMS) for the analysis of the chemical composition of fingerprints is evaluated. It was found that C60(+) SIMS could be used to detect and image the spatial localization of a number of sebaceous and eccrine components in fingerprints. These analyses were also found to not be hindered by the use of common latent print powder development techniques. Finally, the ability to monitor the depth… CONTINUE READING

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