Estimation of delay variations due to random-dopant fluctuations in nanoscale CMOS circuits

@article{Mahmoodi2004EstimationOD,
  title={Estimation of delay variations due to random-dopant fluctuations in nanoscale CMOS circuits},
  author={Hamid Mahmoodi and Saibal Mukhopadhyay and Kaushik Roy},
  journal={IEEE Journal of Solid-State Circuits},
  year={2004},
  volume={40},
  pages={1787-1796}
}
In nanoscale CMOS circuits the random dopant fluctuations (RDF) cause significant threshold voltage (Vt) variations in transistors. In this paper, we propose a semi-analytical estimation methodology to predict the delay distribution [Mean and Standard Deviation (STD)] of logic circuits considering Vt variation in transistors. The proposed method is fast and can be used to predict delay distribution in nanoscale CMOS technologies both at the circuit and the device design phase. The method is… CONTINUE READING
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References

Publications referenced by this paper.
Showing 1-10 of 13 references

Fundamentals of Modern VLSI Devices

  • Y. Taur, T. H. Ning
  • 1998
Highly Influential
8 Excerpts

, “ A simple short - channel MOSFET model and its application to delay analysis of inverters and series - connected MOSFETs , ” in

  • Sakurai, A. R. Newton
  • Proc . IEEE Int . Symp . Circuits and Systems
  • 2002

Modeling and analysis of manufacturing variations

  • S. R. Nassif
  • Proc. Custom Integrated Circuit Conf., 2001, pp…
  • 2001
1 Excerpt

The impact of intrinsic device fluctuations on CMOS SRAM cell stability

  • A. Bhavnagarwala, X. Tang, J. D. Meindl
  • IEEE J. Solid-State Circuits, vol. 36, no. 4, pp…
  • 2001
2 Excerpts

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