Estimation of Analog Parametric Test Metrics Using Copulas

Abstract

A new technique for the estimation of analog parametric test metrics at the design stage is presented in this paper. This technique employs the copulas theory to estimate the distribution between random variables that represent the performances and the test measurements of the circuit under test (CUT). A copulas-based model separates the dependencies… (More)
DOI: 10.1109/TCAD.2011.2149522

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