Estimating defect-type distributions through volume diagnosis and defect behavior attribution

@article{Yu2010EstimatingDD,
  title={Estimating defect-type distributions through volume diagnosis and defect behavior attribution},
  author={Xiaochun Yu and R. D. Blanton},
  journal={2010 IEEE International Test Conference},
  year={2010},
  pages={1-10}
}
We propose a methodology that effectively estimates the defect-type distribution that affects a design fabricated in a given manufacturing process. Understanding the distribution can improve design quality, test quality, and the manufacturing process itself. The methodology is composed of i) an improved approach for identifying the signal lines relevant to defect activation at each site reported by diagnosis, ii) a new behavior attribution method, and iii) a novel approach to estimate the… CONTINUE READING
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