Erratic bits classification for efficient repair strategies in automotive embedded flash memories

  title={Erratic bits classification for efficient repair strategies in automotive embedded flash memories},
  author={Cristian Zambelli and Piero Olivo and Gert Koebernik and Rudolf Ullmann and Matthias Bauer and Georg Tempel},
  journal={2013 IEEE International Reliability Physics Symposium (IRPS)},
The automotive environment is particularly challenging in terms of requested reliability for electronic components. Flash memories commonly exploited in this framework are subject to this paradigm as well. In semiconductor memories erratic bits are infamously known as a major reliability threat to be handled by repair strategies which spans from static redundancy to dynamic correction codes. Both resources are limited in their amount and correction strength, therefore their usage must be… CONTINUE READING
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