Epitaxially influenced boundary layer model for size effect in thin metallic films

@article{Baant2005EpitaxiallyIB,
  title={Epitaxially influenced boundary layer model for size effect in thin metallic films},
  author={Zdeněk P. Ba{\vz}ant and Zaoyang Guo and Horacio Dante Espinosa and Yong Zhu and Bowen Peng},
  journal={Journal of Applied Physics},
  year={2005},
  volume={97},
  pages={073506}
}
It is shown that the size effect recently observed by Espinosa et al., [J. Mech. Phys. Solids51, 47 (2003)] in pure tension tests on free thin metallic films can be explained by the existence of a boundary layer of fixed thickness, located at the surface of the film that was attached onto the substrate during deposition. The boundary layer is influenced by the epitaxial effects of crystal growth on the dislocation density and texture (manifested by prevalent crystal plane orientations). This… Expand
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