Epitaxial checkerboard arrangement of nanorods in ZnMnGaO 4 films studied by x-ray diffraction

@article{OMalley2008EpitaxialCA,
  title={Epitaxial checkerboard arrangement of nanorods in ZnMnGaO 4 films studied by x-ray diffraction},
  author={Sean M. O'Malley and Peter L. Bonanno and Keun hyuk Ahn and Andrei Sirenko and Alexander Kazimirov and S. Park and Sang‐Wook Cheong},
  journal={Physical Review B},
  year={2008},
  volume={78},
  pages={165424}
}
The intriguing nano-structural properties of a ZnMnGaO4 film epitaxially grown on MgO (001) substrate have been investigated using synchrotron radiation-based x-ray diffraction. The ZnMnGaO4 film consisted of a self-assembled checkerboard (CB) structure with perfectly aligned and regularly spaced vertical nanorods. The lattice parameters of the orthorhombic and rotated tetragonal phases of the CB structure were analyzed using H-K, H-L, and K-L cross sections of the reciprocal space maps… 
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