Epitaxial alloyed films out of the bulk stability domain: surface structure and composition of Ni3Al and NiAl films on a stepped Ni(111) surface

Abstract

We have studied by Spot Profile Analysis Low Energy Electron Diffraction (SPALEED) and Auger Electron Spectroscopy (AES) Ni-Al alloyed layers formed by annealing, around 780 K, Al deposits on a stepped Ni(111) surface. The surface structure and composition of the thin epitaxial Ni3Al and NiAl films, obtained respectively below and above a critical Al… (More)

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