• Corpus ID: 227239402

Entanglement negativity at the critical point of measurement-driven transition

  title={Entanglement negativity at the critical point of measurement-driven transition},
  author={Bowen Shi and Xin Dai and Yuan-Ming Lu},
  journal={arXiv: Statistical Mechanics},
We study the entanglement behavior of a random unitary circuit punctuated by projective measurements at the measurement-driven phase transition in one spatial dimension. We numerically study the logarithmic entanglement negativity of two disjoint intervals and find that it scales as a power of the cross-ratio. We investigate two systems: (1) Clifford circuits with projective measurements, and (2) Haar random local unitary circuit with projective measurements. Previous results of entanglement… 

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