Enabling energy efficient reliability in embedded systems through smart cache cleaning

@article{Jeyapaul2013EnablingEE,
  title={Enabling energy efficient reliability in embedded systems through smart cache cleaning},
  author={Reiley Jeyapaul and Aviral Shrivastava},
  journal={ACM Trans. Design Autom. Electr. Syst.},
  year={2013},
  volume={18},
  pages={53:1-53:25}
}
Incessant and rapid technology scaling has brought us to a point where today's, and future transistors are susceptible to transient errors induced by energy carrying particles, called soft errors. Within a processor, the sheer size and nature of data in the caches render it most vulnerable to electrical interference on data stored in the cache. Data in the cache is vulnerable to corruption by soft errors, for the time it remains actively unused in the cache. Write-through and early-write-back… CONTINUE READING

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