EnBay: A Novel Pattern-Based Bayesian Classifier

  title={EnBay: A Novel Pattern-Based Bayesian Classifier},
  author={Elena Baralis and Luca Cagliero and Paolo Garza},
  journal={IEEE Transactions on Knowledge and Data Engineering},
A promising approach to Bayesian classification is based on exploiting frequent patterns, i.e., patterns that frequently occur in the training data set, to estimate the Bayesian probability. Pattern-based Bayesian classification focuses on building and evaluating reliable probability approximations by exploiting a subset of frequent patterns tailored to a given test case. This paper proposes a novel and effective approach to estimate the Bayesian probability. Differently from previous… CONTINUE READING
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