Empirical evaluation of NAND flash memory performance

@article{Desnoyers2010EmpiricalEO,
  title={Empirical evaluation of NAND flash memory performance},
  author={Peter Desnoyers},
  journal={Operating Systems Review},
  year={2010},
  volume={44},
  pages={50-54}
}
Reports of NAND ash device testing in the literature have for the most part been limited to examination of circuit-level parameters on raw ash chips or prototypes, and system-level parameters on entire storage subsystems. However, there has been little examination of system-level parameters of raw devices, such as mean latency and endurance values. We… CONTINUE READING

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